photothermal

1 post

materials science in semiconductors

Bruker expands photothermal AFM-IR deployment with Dimension IconIR at imec for nanoscale semiconductor metrology

Bruker announced placement of its Dimension IconIR photothermal AFM-IR system at imec under a joint development project focused on nanoscale chemical characterization for advanced semiconductor research. The collaboration may be relevant to intellectual property, product specification, and regulatory considerations in materials and process development.